XRF X-Ray Fluorescence Spectrometer Spec

CAMERA SYSTEM:

. High pixel resolution CCD

. 32bit true color

. Display ray irradiation position vividly

. With small caliber collimators can realize precise point measurement

. The special configuration of the background light will guarantee the image clearly when testing substance 

ADVANTAGES & FEATURES:

. Using the world most advanced electric refrigeration SDD semiconductor detector with <145eV at 300.000

cps, Copper (Cu) count rate >400,000cps

. Without liquid nitrogen refrigeration for detector cooling

. 2048 multichannel spectrometer measurement display, Quick measurement time and load easily for fast sample exchange

. To ensure the accuracy of test data, our products has integrated empirical coefficient method, air mode and oil-free Vacuum mode measurement methods, fundamental parameter method ( FP method), theoretical alpha coefficient method and other classical analytical methods.

. Automatically detect variety of elements simultaneously

. Manual door chamber or automatic door chamber by PC control with hand finger pinch guard protection

. NDE will not damage the physical and the chemical properties of the sample (protected by thermal overload protection)

. Material / samples which can be measured by our machine are solid types / particles and liquid types

. Flexibility in hardware configuration to accommodate a second X-ray tube with different target material covering a wide range of (spot size critical) application (for upgrade purpose)

. Professional analysis and evaluation software is able to realize the pattern recognition, automatic classification, open software system, the user can create library file according to their need, Identification, background correction, quantitative standard-based and standardless analysis, 10x/100x Magnification

. With windows interface application, friendly man-machine interface system measurement with direct display of measurement results, Multi-layer thin film analysis for 12 individual layers with 25 elements each

. Software database powerful, spectrum data, spectral peak marker, energy calibration, intensity, net preset time, Spectrum processing, background subtraction, element identification, stripping the overlapped spectra automatically  2 images from different magnification simultaneous, Layer thickness calculation in Single point, Line Scan and visual display of mapping mode.

. The software can automatically spectrum when peak overlap, spectrum stabilization, to eliminate the impact of  environmental changes, Linear fitting, matrix correction,  analyze of ROSH instruction.

SYSTEM CONTROLLER (PC based control with requirements as follows:)

. Processor Intel Core i7 (min. 1.6Ghz)

. Memory 8Gb DDR-3

. Internal hardisk drive 1Tb

. LED Monitor min.24 inch.

. OS WinXP/Windows 7 (64-bit) Pro (Original)

. accessories

. Uninterruptible power supply (UPS) min. 650VA (Opt.)

. Inkjet printer (Opt.)

. Working table (Opt.)